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	1.	Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishing. [electronic resource] by Chen, J Ivey, D G Producer: 20020722 In: Micron (Oxford, England : 1993) vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Cross-sectional TEM specimens of metal contacts to semiconductors. [electronic resource] by Ivey, D G Piercy, G R Producer: 19890615 In: Journal of electron microscopy technique vol. 8 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Microstructural and in vitro chemical investigations into plasma-sprayed bioceramic coatings. [electronic resource] by Heimann, R B Kurzweg, H Ivey, D G Wayman, M L Producer: 19990315 In: Journal of biomedical materials research vol. 43 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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