Your search returned 3 results.

Results
	1.	An Overview of Normally-Off GaN-Based High Electron Mobility Transistors. [electronic resource] by Roccaforte, Fabrizio Greco, Giuseppe Fiorenza, Patrick Iucolano, Ferdinando Publication details: Materials (Basel, Switzerland) May 2019 In: Materials (Basel, Switzerland) vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Conduction Mechanisms at Interface of AlN/SiN Dielectric Stacks with AlGaN/GaN Heterostructures for Normally-off High Electron Mobility Transistors: Correlating Device Behavior with Nanoscale Interfaces Properties. [electronic resource] by Greco, Giuseppe Fiorenza, Patrick Iucolano, Ferdinando Severino, Andrea Giannazzo, Filippo Roccaforte, Fabrizio Producer: 20180730 In: ACS applied materials & interfaces vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Electron trapping at SiO [electronic resource] by Fiorenza, Patrick Iucolano, Ferdinando Nicotra, Giuseppe Bongiorno, Corrado Deretzis, Ioannis La Magna, Antonino Giannazzo, Filippo Saggio, Mario Spinella, Corrado Roccaforte, Fabrizio Producer: 20180725 In: Nanotechnology vol. 29 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

Refine your search