APA

Tolstogouzov A., Drozdov M. N., Belykh S. F., Gololobov G. P., Ieshkin A. E., Mazarov P., Suvorov D. V., Fu D., Pelenovich V., Zeng X. & Zuo W. (20190130). Cluster secondary ion emission of silicon: An influence of the samples' dimensional features. : Rapid communications in mass spectrometry : RCM.

Chicago

Tolstogouzov Alexander, Drozdov Mikhail N, Belykh Sergey F, Gololobov Gennady P, Ieshkin Alexei E, Mazarov Paul, Suvorov Dmitriy V, Fu Dejun, Pelenovich Vasiliy, Zeng Xiaomei and Zuo Wenbin. 20190130. Cluster secondary ion emission of silicon: An influence of the samples' dimensional features. : Rapid communications in mass spectrometry : RCM.

Harvard

Tolstogouzov A., Drozdov M. N., Belykh S. F., Gololobov G. P., Ieshkin A. E., Mazarov P., Suvorov D. V., Fu D., Pelenovich V., Zeng X. and Zuo W. (20190130). Cluster secondary ion emission of silicon: An influence of the samples' dimensional features. : Rapid communications in mass spectrometry : RCM.

MLA

Tolstogouzov Alexander, Drozdov Mikhail N, Belykh Sergey F, Gololobov Gennady P, Ieshkin Alexei E, Mazarov Paul, Suvorov Dmitriy V, Fu Dejun, Pelenovich Vasiliy, Zeng Xiaomei and Zuo Wenbin. Cluster secondary ion emission of silicon: An influence of the samples' dimensional features. : Rapid communications in mass spectrometry : RCM. 20190130.