APA

Wimmer C., Bonomo F., Hurlbatt A., Schiesko L., Fantz U., Harder N. d., Heinemann B., Mimo A., Orozco G., Agostini M., Barbisan M., Brombin M., Delogu R., Pimazzoni A., Poggi C., Serianni G., Ugoletti M. & Veltri P. (2020). Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility. : The Review of scientific instruments.

Chicago

Wimmer C, Bonomo F, Hurlbatt A, Schiesko L, Fantz U, Harder N den, Heinemann B, Mimo A, Orozco G, Agostini M, Barbisan M, Brombin M, Delogu R, Pimazzoni A, Poggi C, Serianni G, Ugoletti M and Veltri P. 2020. Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility. : The Review of scientific instruments.

Harvard

Wimmer C., Bonomo F., Hurlbatt A., Schiesko L., Fantz U., Harder N. d., Heinemann B., Mimo A., Orozco G., Agostini M., Barbisan M., Brombin M., Delogu R., Pimazzoni A., Poggi C., Serianni G., Ugoletti M. and Veltri P. (2020). Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility. : The Review of scientific instruments.

MLA

Wimmer C, Bonomo F, Hurlbatt A, Schiesko L, Fantz U, Harder N den, Heinemann B, Mimo A, Orozco G, Agostini M, Barbisan M, Brombin M, Delogu R, Pimazzoni A, Poggi C, Serianni G, Ugoletti M and Veltri P. Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility. : The Review of scientific instruments. 2020.