Comparison of the Thermal Degradation of Heavily Nb-Doped and Normal PZT Thin Films. [electronic resource]

By: Contributor(s): Producer: 20180911Description: 617-622 p. digitalISSN:
  • 1525-8955
Online resources: In: IEEE transactions on ultrasonics, ferroelectrics, and frequency control vol. 64
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Publication Type: Journal Article

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