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	1.	Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensing. [electronic resource] by Zhang, Weijie Chen, Yuhang Hou, Yaoping Wang, Wenting Liu, Huarong Zheng, Lei Publication details: Ultramicroscopy Dec 2019 In: Ultramicroscopy vol. 207 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Metasurface-enhanced optical lever sensitivity for atomic force microscopy. [electronic resource] by Yao, Zan Xia, Xicheng Hou, Yaoping Zhang, Peng Zhai, Xiaomin Chen, Yuhang Publication details: Nanotechnology Sep 2019 In: Nanotechnology vol. 30 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Efficient fabrication of a high-aspect-ratio AFM tip by one-step exposure of a long focal depth holographic femtosecond axilens beam. [electronic resource] by Pan, Deng Liu, Shunli Ji, Shengyun Cai, Ze Li, Jiawen Hou, Yaoping Zhang, Weijie Fan, Shengying Li, Rui Hu, Yanlei Zhu, Wulin Wu, Dong Chu, Jiaru Producer: 20200218 In: Optics letters vol. 45 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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