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Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy. [electronic resource] by
- Bangert, U
- Stewart, A
- O'Connell, E
- Courtney, E
- Ramasse, Q
- Kepaptsoglou, D
- Hofsäss, H
- Amani, J
- Tu, J-S
- Kardynal, B
Producer: 20180723
In:
Ultramicroscopy vol. 176
Availability: No items available.
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Ion implantation of graphene-toward IC compatible technologies. [electronic resource] by
- Bangert, U
- Pierce, W
- Kepaptsoglou, D M
- Ramasse, Q
- Zan, R
- Gass, M H
- Van den Berg, J A
- Boothroyd, C B
- Amani, J
- Hofsäss, H
Producer: 20140513
In:
Nano letters vol. 13
Availability: No items available.
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