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	1.	Absolute surface coverage measurement using a vibrational overtone. [electronic resource] by Pipino, Andrew C R Hoefnagels, Johan P M Watanabe, Noboru Producer: 20060502 In: The Journal of chemical physics vol. 120 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation framework. [electronic resource] by Maraghechi, Siavash Hoefnagels, Johan P M Peerlings, Ron H J Geers, Marc G D Producer: 20180809 In: Ultramicroscopy vol. 187 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Ultra-Stretchable Interconnects for High-Density Stretchable Electronics. [electronic resource] by Shafqat, Salman Hoefnagels, Johan P M Savov, Angel Joshi, Shivani Dekker, Ronald Geers, Marc G D Publication details: Micromachines Sep 2017 In: Micromachines vol. 8 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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