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	1.	Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy. [electronic resource] by Han, Cheolsu Chung, Chung Choo Producer: 20110930 In: The Review of scientific instruments vol. 82 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Edge shadow projection method for measuring the brightness of electron guns. [electronic resource] by Han, Cheolsu Sul, Inho Cho, Boklae Producer: 20180205 In: The Review of scientific instruments vol. 88 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Automatic approaching method for atomic force microscope using a Gaussian laser beam. [electronic resource] by Han, Cheolsu Lee, Haiwon Chung, Chung Choo Producer: 20091009 In: The Review of scientific instruments vol. 80 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Atomic force microscope anodization lithography using pulsed bias voltage synchronized with resonance frequency of cantilever. [electronic resource] by Bae, Sukjong Han, Cheolsu Kim, Moo-Sub Choo Chung, Chung Lee, Haiwon Producer: 20121002 In: Nanotechnology vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Note: O-ring stack system for electron gun alignment. [electronic resource] by Park, In-Yong Cho, Boklae Han, Cheolsu Shin, Seungmin Lee, Dongjun Ahn, Sang Jung Producer: 20150930 In: The Review of scientific instruments vol. 86 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Feasibility of multi-walled carbon nanotube probes in AFM anodization lithography. [electronic resource] by Sun Choi, Ji Bae, Sukjong Jung Ahn, Sang Hyun Kim, Dal Young Jung, Ki Han, Cheolsu Choo Chung, Chung Lee, Haiwon Producer: 20070925 In: Ultramicroscopy vol. 107 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)