APA
Das A., Gupta R. K., Modi M. H., Mukherjee C., Rai S. K., Bose A., Ganguli T., Joshi S. C., Lodha G. S. & Deb S. K. (20130118). Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivity. : Applied optics.
Chicago
Das Arijeet, Gupta Rajkumar K, Modi Mohammed H, Mukherjee Chandrachur, Rai Sanjay K, Bose Aniruddha, Ganguli Tapas, Joshi Satish C, Lodha Gyan S and Deb Sudip K. 20130118. Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivity. : Applied optics.
Harvard
Das A., Gupta R. K., Modi M. H., Mukherjee C., Rai S. K., Bose A., Ganguli T., Joshi S. C., Lodha G. S. and Deb S. K. (20130118). Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivity. : Applied optics.
MLA
Das Arijeet, Gupta Rajkumar K, Modi Mohammed H, Mukherjee Chandrachur, Rai Sanjay K, Bose Aniruddha, Ganguli Tapas, Joshi Satish C, Lodha Gyan S and Deb Sudip K. Fine structures in refractive index of sapphire at the L(II,III) absorption edge of aluminum determined by soft x-ray resonant reflectivity. : Applied optics. 20130118.