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Results of search for 'au:"Grigg, David"'
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Authors
Bell, Bruce M
Biegen, Jim
Clark, Jack
Gilbert, Jeffrey R
Grigg, David
Hanley, Patrick S
Mukhopadhyay, Sukrit
O'Brien, John P
Xia, Shijing
Zu, Chengli
de Groot, Peter
de Lega, Xavier Colonna
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1.
Optical interferometry for measurement of the geometric dimensions of industrial parts.
[electronic resource]
by
de Groot, Peter
Biegen, Jim
Clark, Jack
de Lega, Xavier Colonna
Grigg, David
Producer:
20020724
In:
Applied optics
vol. 41
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2.
Fragmentation of Protonated N-(3-Aminophenyl)Benzamide and Its Derivatives in Gas Phase.
[electronic resource]
by
Zu, Chengli
Mukhopadhyay, Sukrit
Hanley, Patrick S
Xia, Shijing
Bell, Bruce M
Grigg, David
Gilbert, Jeffrey R
O'Brien, John P
Producer:
20160905
In:
Journal of the American Society for Mass Spectrometry
vol. 27
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No items available.
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