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	1.	Circuit editing of copper and low-k dielectrics in nanotechnology devices. [electronic resource] by Mosselveld, F Makarov, V V Lundquist, T R Griffis, D P Russell, P E Producer: 20040701 In: Journal of microscopy vol. 214 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Focused ion beam characterization of bicomponent polymer fibers. [electronic resource] by Wong, K C Haslauer, C M Anantharamaiah, N Pourdeyhimi, B Batchelor, A D Griffis, D P Producer: 20100809 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Correlative light, electron, and ion microscopy on a single histologic section. [electronic resource] by Kupke, K G Pickett, J P Ingram, P Griffis, D P Linton, R W Shelburne, J D Producer: 19831028 In: Journal of microscopy vol. 131 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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