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Materials characterisation by angle-resolved scanning transmission electron microscopy. [electronic resource] by
- Müller-Caspary, Knut
- Oppermann, Oliver
- Grieb, Tim
- Krause, Florian F
- Rosenauer, Andreas
- Schowalter, Marco
- Mehrtens, Thorsten
- Beyer, Andreas
- Volz, Kerstin
- Potapov, Pavel
Producer: 20180503
In:
Scientific reports vol. 6
Availability: No items available.
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15.
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Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy. [electronic resource] by
- Müller-Caspary, Knut
- Grieb, Tim
- Müßener, Jan
- Gauquelin, Nicolas
- Hille, Pascal
- Schörmann, Jörg
- Verbeeck, Johan
- Van Aert, Sandra
- Eickhoff, Martin
- Rosenauer, Andreas
Producer: 20190404
In:
Physical review letters vol. 122
Availability: No items available.
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16.
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Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence. [electronic resource] by
- Grieb, Tim
- Krause, Florian F
- Schowalter, Marco
- Zillmann, Dennis
- Sellin, Roman
- Müller-Caspary, Knut
- Mahr, Christoph
- Mehrtens, Thorsten
- Bimberg, Dieter
- Rosenauer, Andreas
Producer: 20180821
In:
Ultramicroscopy vol. 190
Availability: No items available.
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Screening Precursor-Solvent Combinations for Li [electronic resource] by
- Meierhofer, Florian
- Li, Haipeng
- Gockeln, Michael
- Kun, Robert
- Grieb, Tim
- Rosenauer, Andreas
- Fritsching, Udo
- Kiefer, Johannes
- Birkenstock, Johannes
- Mädler, Lutz
- Pokhrel, Suman
Producer: 20180724
In:
ACS applied materials & interfaces vol. 9
Availability: No items available.
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18.
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Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction. [electronic resource] by
- Mahr, Christoph
- Müller-Caspary, Knut
- Ritz, Robert
- Simson, Martin
- Grieb, Tim
- Schowalter, Marco
- Krause, Florian F
- Lackmann, Anastasia
- Soltau, Heike
- Wittstock, Arne
- Rosenauer, Andreas
Producer: 20190215
In:
Ultramicroscopy vol. 196
Availability: No items available.
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19.
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Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy. [electronic resource] by
- Müller-Caspary, Knut
- Krause, Florian F
- Grieb, Tim
- Löffler, Stefan
- Schowalter, Marco
- Béché, Armand
- Galioit, Vincent
- Marquardt, Dennis
- Zweck, Josef
- Schattschneider, Peter
- Verbeeck, Johan
- Rosenauer, Andreas
Producer: 20180723
In:
Ultramicroscopy vol. 178
Availability: No items available.
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20.
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Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction. [electronic resource] by
- Carvalho, Daniel
- Müller-Caspary, Knut
- Schowalter, Marco
- Grieb, Tim
- Mehrtens, Thorsten
- Rosenauer, Andreas
- Ben, Teresa
- García, Rafael
- Redondo-Cubero, Andrés
- Lorenz, Katharina
- Daudin, Bruno
- Morales, Francisco M
Producer: 20180423
In:
Scientific reports vol. 6
Availability: No items available.
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