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	1.	3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography. [electronic resource] by Kambham, Ajay Kumar Kumar, Arul Gilbert, Matthieu Vandervorst, Wilfried Producer: 20140424 In: Ultramicroscopy vol. 132 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy. [electronic resource] by Vurpillot, Francois Danoix, Frédéric Gilbert, Matthieu Koelling, Sebastian Dagan, Michal Seidman, David N Producer: 20180720 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Atomic insight into Ge₁₋xSnx using atom probe tomography. [electronic resource] by Kumar, Arul Komalan, Manu P Lenka, Haraprasanna Kambham, Ajay Kumar Gilbert, Matthieu Gencarelli, Federica Vincent, Benjamin Vandervorst, Wilfried Producer: 20140424 In: Ultramicroscopy vol. 132 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Titanium Implant Failure After Chest Wall Osteosynthesis. [electronic resource] by Berthet, Jean-Philippe Gomez Caro, Abel Solovei, Laurence Gilbert, Matthieu Bommart, Sébastien Gaudard, Philippe Canaud, Ludovic Alric, Pierre Marty-Ané, Charles-Henri Producer: 20150813 In: The Annals of thoracic surgery vol. 99 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)