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	1.	Reconstructing atom probe data: a review. [electronic resource] by Vurpillot, Francois Gault, Baptiste Geiser, Brian P Larson, D J Producer: 20140424 In: Ultramicroscopy vol. 132 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	On the use of simulated field-evaporated specimen apex shapes in atom probe tomography data reconstruction. [electronic resource] by Larson, David J Geiser, Brian P Prosa, Ty J Kelly, Thomas F Producer: 20130322 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Electrostatic simulations of a local electrode atom probe: the dependence of tomographic reconstruction parameters on specimen and microscope geometry. [electronic resource] by Loi, Shyeh Tjing Gault, Baptiste Ringer, Simon P Larson, David J Geiser, Brian P Producer: 20140424 In: Ultramicroscopy vol. 132 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Spatial distribution maps for atom probe tomography. [electronic resource] by Geiser, Brian P Kelly, Thomas F Larson, David J Schneir, Jason Roberts, Jay P Producer: 20080122 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 13 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)