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Results of search for 'au:"Forbes, B D"'
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Authors
Allen, L J
Barthel, J
Brown, H G
D'Alfonso, A J
Dunin-Borkowski, R E
Findlay, S D
Forbes, B D
Houben, L
Krause, F F
Lebeau, J M
Mayer, J
Rosenauer, A
Stemmer, S
Urban, K
Van Dyck, D
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Topics
Computer Simulation
Electrons
Helium
Ions
Microscopy, Electron, Scanning Transmission
Microscopy, Energy-Filtering Transmission Electron
Models, Theoretical
Oxides
Phonons
Quantum Theory
Spectroscopy, Electron Energy-Loss
Strontium
Titanium
chemistry
methods
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English
Your search returned 6 results.
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1.
The interaction of a nanoscale coherent helium-ion probe with a crystal.
[electronic resource]
by
D'Alfonso, A J
Forbes, B D
Allen, L J
Producer:
20140414
In:
Ultramicroscopy
vol. 134
Online resources:
Available from publisher's website
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No items available.
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2.
Addressing preservation of elastic contrast in energy-filtered transmission electron microscopy.
[electronic resource]
by
Brown, H G
D'Alfonso, A J
Forbes, B D
Allen, L J
Producer:
20160415
In:
Ultramicroscopy
vol. 160
Online resources:
Available from publisher's website
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No items available.
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3.
A quantum mechanical exploration of phonon energy-loss spectroscopy using electrons in the aloof beam geometry.
[electronic resource]
by
Allen, L J
Brown, H G
Findlay, S D
Forbes, B D
Producer:
20180328
In:
Microscopy (Oxford, England)
vol. 67
Online resources:
Available from publisher's website
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4.
Elemental mapping in achromatic atomic-resolution energy-filtered transmission electron microscopy.
[electronic resource]
by
Forbes, B D
Houben, L
Mayer, J
Dunin-Borkowski, R E
Allen, L J
Producer:
20150331
In:
Ultramicroscopy
vol. 147
Online resources:
Available from publisher's website
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5.
Thermal diffuse scattering in transmission electron microscopy.
[electronic resource]
by
Forbes, B D
D'Alfonso, A J
Findlay, S D
Van Dyck, D
Lebeau, J M
Stemmer, S
Allen, L J
Producer:
20120322
In:
Ultramicroscopy
vol. 111
Online resources:
Available from publisher's website
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No items available.
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6.
Atomic resolution elemental mapping using energy-filtered imaging scanning transmission electron microscopy with chromatic aberration correction.
[electronic resource]
by
Krause, F F
Rosenauer, A
Barthel, J
Mayer, J
Urban, K
Dunin-Borkowski, R E
Brown, H G
Forbes, B D
Allen, L J
Producer:
20181022
In:
Ultramicroscopy
vol. 181
Online resources:
Available from publisher's website
Availability:
No items available.
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