Modeling the effects of density dependent emigration, weak Allee effects, and matrix hostility on patch-level population persistence. [electronic resource]

By: Contributor(s): Producer: 20200519Description: 1718-1742 p. digitalISSN:
  • 1551-0018
Online resources: In: Mathematical biosciences and engineering : MBE vol. 17
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Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.

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