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	1.	Defect Detection in Textures through the Use of Entropy as a Means for Automatically Selecting the Wavelet Decomposition Level. [electronic resource] by Navarro, Pedro J Fernández-Isla, Carlos Alcover, Pedro María Suardíaz, Juan Producer: 20180123 In: Sensors (Basel, Switzerland) vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Sensors systems for the automation of operations in the ship repair industry. [electronic resource] by Navarro, Pedro Javier Muro, Juan Suardíaz Alcover, Pedro María Fernández-Isla, Carlos Producer: 20140227 In: Sensors (Basel, Switzerland) vol. 13 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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