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	1.	Wafer defect detection by a polarization-insensitive external differential interference contrast module. [electronic resource] by Nativ, Amit Feldman, Haim Shaked, Natan T Producer: 20180628 In: Applied optics vol. 57 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Broadband Infrared Spectroscopy for Non-Contact Measurement of Neurological Disease Biomarkers in Cerebrospinal Fluid. [electronic resource] by Horosh, Michael Feldman, Haim Yablonovich, Avi Firer, Michael A Abookasis, David Producer: 20180904 In: Applied spectroscopy vol. 71 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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