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	1.	Distortion induced effects on the finesse of high-performance large-aperture Fabry-Perot etalon filters. [electronic resource] by Zhang, J Arkwright, J W Farrant, D I Producer: 20130704 In: Optics express vol. 14 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Dynamic range of Ronchi test with a phase-shifted sinusoidal grating. [electronic resource] by Hibino, K Farrant, D I Ward, B K Oreb, B F Producer: 20121002 In: Applied optics vol. 36 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method. [electronic resource] by Takatsuji, T Oreb, B F Farrant, D I Tyrer, J R Producer: 20121002 In: Applied optics vol. 36 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Calibration of a 300-mm-aperture phase-shifting Fizeau interferometer. [electronic resource] by Oreb, B B Farrant, D I Walsh, C J Forbes, G Fairman, P S Producer: 20091216 In: Applied optics vol. 39 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Fabrication and measurement of optics for the laser interferometer gravitational wave observatory. [electronic resource] by Walsh, C J Leistner, A J Seckold, J Oreb, B F Farrant, D I Producer: 20100610 In: Applied optics vol. 38 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Demonstration of nonlinear absorption in Au semi-continuous film by electrical measurement. [electronic resource] by Yajadda, M M A Farrant, D I Levchenko, I Müller, K-H Ostrikov, K Producer: 20120116 In: Optics express vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry. [electronic resource] by Farrant, D I Kaufmann, G H Petzing, J N Tyrer, J R Oreb, B F Kerr, D Producer: 20121002 In: Applied optics vol. 37 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)