APA

Goiffon V., Girard S., Chabane A., Paillet P., Magnan P., Cervantes P., Martin-Gonthier P., Baggio J., Estribeau M., Bourgade J., Darbon S., Rousseau A., Glebov V. Y., Pien G. & Sangster T. C. (20130322). Vulnerability of CMOS image sensors in Megajoule Class Laser harsh environment. : Optics express.

Chicago

Goiffon V, Girard S, Chabane A, Paillet P, Magnan P, Cervantes P, Martin-Gonthier P, Baggio J, Estribeau M, Bourgade J-L, Darbon S, Rousseau A, Glebov V Yu, Pien G and Sangster T C. 20130322. Vulnerability of CMOS image sensors in Megajoule Class Laser harsh environment. : Optics express.

Harvard

Goiffon V., Girard S., Chabane A., Paillet P., Magnan P., Cervantes P., Martin-Gonthier P., Baggio J., Estribeau M., Bourgade J., Darbon S., Rousseau A., Glebov V. Y., Pien G. and Sangster T. C. (20130322). Vulnerability of CMOS image sensors in Megajoule Class Laser harsh environment. : Optics express.

MLA

Goiffon V, Girard S, Chabane A, Paillet P, Magnan P, Cervantes P, Martin-Gonthier P, Baggio J, Estribeau M, Bourgade J-L, Darbon S, Rousseau A, Glebov V Yu, Pien G and Sangster T C. Vulnerability of CMOS image sensors in Megajoule Class Laser harsh environment. : Optics express. 20130322.