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Results of search for 'au:"Elssner, K E"'
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Authors
Blümel, T
Burow, R
Elssner, K E
Grzanna, J
Lindlein, N
Merkel, K
Pfund, J
Schulz, G
Schwider, J
Spolaczyk, R
Vogel, A
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Your search returned 7 results.
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1.
Errors in phase-measurement interferometry with high numerical apertures.
[electronic resource]
by
Schulz, G
Elssner, K E
Producer:
20121002
In:
Applied optics
vol. 30
Online resources:
Available from publisher's website
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No items available.
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2.
Absolute sphericity measurement.
[electronic resource]
by
Elssner, K E
Burow, R
Grzanna, J
Spolaczyk, R
Producer:
20121002
In:
Applied optics
vol. 28
Online resources:
Available from publisher's website
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No items available.
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3.
Establishing a flatness standard.
[electronic resource]
by
Elssner, K E
Vogel, A
Grzanna, J
Schulz, G
Producer:
20121002
In:
Applied optics
vol. 33
Online resources:
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4.
Semiconductor wafer and technical flat planeness testing interferometer.
[electronic resource]
by
Schwider, J
Burow, R
Elssner, K E
Grzanna, J
Spolaczyk, R
Producer:
20121002
In:
Applied optics
vol. 25
Online resources:
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5.
Homogeneity testing by phase sampling interferometry.
[electronic resource]
by
Schwider, J
Burow, R
Elssner, K E
Spolaczyk, R
Grzanna, J
Producer:
20121002
In:
Applied optics
vol. 24
Online resources:
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6.
Digital wave-front measuring interferometry: some systematic error sources.
[electronic resource]
by
Schwider, J
Burow, R
Elssner, K E
Grzanna, J
Spolaczyk, R
Merkel, K
Producer:
20121002
In:
Applied optics
vol. 22
Online resources:
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7.
Absolute sphericity measurement: a comparative study of the use of interferometry and a Shack-Hartmann sensor.
[electronic resource]
by
Pfund, J
Lindlein, N
Schwider, J
Burow, R
Blümel, T
Elssner, K E
Producer:
20121002
In:
Optics letters
vol. 23
Online resources:
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