Electrochemical aspects and structure characterization of VA-VIA compound semiconductor Bi2Te3/Sb2Te3 superlattice thin films via electrochemical atomic layer epitaxy. [electronic resource]

By: Contributor(s): Producer: 20080722Description: 5919-24 p. digitalISSN:
  • 0743-7463
Subject(s): Online resources: In: Langmuir : the ACS journal of surfaces and colloids vol. 24
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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