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	1.	Spectroscopic electron tomography. [electronic resource] by Möbus, Günter Doole, Ron C Inkson, Beverley J Producer: 20031105 In: Ultramicroscopy vol. 96 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Characterization of magnetic nanoparticles using energy-selected transmission electron microscopy. [electronic resource] by Sayagués, María J Rojas, Teresa C Fernández, Asunción Dunin-Borkowski, Rafal E Doole, Ron C Hutchison, John L Producer: 20030205 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 8 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. [electronic resource] by Hutchison, John L Titchmarsh, John M Cockayne, David J H Doole, Ron C Hetherington, Crispin J D Kirkland, Angus I Sawada, H Producer: 20050502 In: Ultramicroscopy vol. 103 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Experimental evaluation of a spherical aberration-corrected TEM and STEM. [electronic resource] by Sawada, Hidetaka Tomita, Takeshi Naruse, Mikio Honda, Toshikazu Hambridge, Paul Hartel, Peter Haider, Maximilian Hetherington, Crispin Doole, Ron Kirkland, Angus Hutchison, John Titchmarsh, John Cockayne, David Producer: 20051025 In: Journal of electron microscopy vol. 54 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)