APA

Artyukov I. A., Feschenko R. M., Vinogradov A. V., Bugayev Y. A., Devizenko O. Y., Kondratenko V. V., Kasyanov Y. S., Hatano T., Yamamoto M. & Saveliev S. V. (20101130). Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics. : Micron (Oxford, England : 1993).

Chicago

Artyukov I A, Feschenko R M, Vinogradov A V, Bugayev Ye A, Devizenko O Y, Kondratenko V V, Kasyanov Yu S, Hatano T, Yamamoto M and Saveliev S V. 20101130. Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics. : Micron (Oxford, England : 1993).

Harvard

Artyukov I. A., Feschenko R. M., Vinogradov A. V., Bugayev Y. A., Devizenko O. Y., Kondratenko V. V., Kasyanov Y. S., Hatano T., Yamamoto M. and Saveliev S. V. (20101130). Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics. : Micron (Oxford, England : 1993).

MLA

Artyukov I A, Feschenko R M, Vinogradov A V, Bugayev Ye A, Devizenko O Y, Kondratenko V V, Kasyanov Yu S, Hatano T, Yamamoto M and Saveliev S V. Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics. : Micron (Oxford, England : 1993). 20101130.