APA

Decker J. E., Miles J. R., Madej A. A., Siemsen R. F., Siemsen K. J., de Bonth S., Bustraan K., Temple S. & Pekelsky J. R. (20031107). Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry--application to absolute long gauge block measurement. : Applied optics.

Chicago

Decker Jennifer E, Miles John R, Madej Alan A, Siemsen Ralph F, Siemsen Klaus J, de Bonth Sebastian, Bustraan Krijn, Temple Sara and Pekelsky James R. 20031107. Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry--application to absolute long gauge block measurement. : Applied optics.

Harvard

Decker J. E., Miles J. R., Madej A. A., Siemsen R. F., Siemsen K. J., de Bonth S., Bustraan K., Temple S. and Pekelsky J. R. (20031107). Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry--application to absolute long gauge block measurement. : Applied optics.

MLA

Decker Jennifer E, Miles John R, Madej Alan A, Siemsen Ralph F, Siemsen Klaus J, de Bonth Sebastian, Bustraan Krijn, Temple Sara and Pekelsky James R. Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry--application to absolute long gauge block measurement. : Applied optics. 20031107.