APA

Nieuwendaal R. C., DeLongchamp D. M., Richter L. J., Snyder C. R., Jones R. L., Engmann S., Herzing A., Heeney M., Fei Z., Sieval A. B. & Hummelen J. C. (20180808). Characterization of Interfacial Structure in Polymer-Fullerene Bulk Heterojunctions via ^{13}C {^{2}H} Rotational Echo Double Resonance NMR. : Physical review letters.

Chicago

Nieuwendaal R C, DeLongchamp D M, Richter L J, Snyder C R, Jones R L, Engmann S, Herzing A, Heeney M, Fei Z, Sieval A B and Hummelen J C. 20180808. Characterization of Interfacial Structure in Polymer-Fullerene Bulk Heterojunctions via ^{13}C {^{2}H} Rotational Echo Double Resonance NMR. : Physical review letters.

Harvard

Nieuwendaal R. C., DeLongchamp D. M., Richter L. J., Snyder C. R., Jones R. L., Engmann S., Herzing A., Heeney M., Fei Z., Sieval A. B. and Hummelen J. C. (20180808). Characterization of Interfacial Structure in Polymer-Fullerene Bulk Heterojunctions via ^{13}C {^{2}H} Rotational Echo Double Resonance NMR. : Physical review letters.

MLA

Nieuwendaal R C, DeLongchamp D M, Richter L J, Snyder C R, Jones R L, Engmann S, Herzing A, Heeney M, Fei Z, Sieval A B and Hummelen J C. Characterization of Interfacial Structure in Polymer-Fullerene Bulk Heterojunctions via ^{13}C {^{2}H} Rotational Echo Double Resonance NMR. : Physical review letters. 20180808.