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Surface determination through atomically resolved secondary-electron imaging. [electronic resource] by
- Ciston, J
- Brown, H G
- D'Alfonso, A J
- Koirala, P
- Ophus, C
- Lin, Y
- Suzuki, Y
- Inada, H
- Zhu, Y
- Allen, L J
- Marks, L D
Producer: 20151124
In:
Nature communications vol. 6
Availability: No items available.
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Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride. [electronic resource] by
- Lozano, J G
- Yang, H
- Guerrero-Lebrero, M P
- D'Alfonso, A J
- Yasuhara, A
- Okunishi, E
- Zhang, S
- Humphreys, C J
- Allen, L J
- Galindo, P L
- Hirsch, P B
- Nellist, P D
Producer: 20150520
In:
Physical review letters vol. 113
Availability: No items available.
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