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	1.	Reference-beam system for measuring relative small-surface local irregularities of a reflective object. [electronic resource] by Cywiak, M Solano, C Producer: 20121002 In: Applied optics vol. 37 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Extreme shearing interferometry: theoretical limits with practical consequences. [electronic resource] by Servin, M Cywiak, M Dávila, A Producer: 20090724 In: Optics express vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Vibrating knife-edge technique for measuring the focal length of a microlens. [electronic resource] by Cywiak, M Servín, M Mendoza Santoyo, F Producer: 20121002 In: Applied optics vol. 40 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Noise in phase shifting interferometry. [electronic resource] by Servin, M Estrada, J C Quiroga, J A Mosiño, J F Cywiak, M Producer: 20090724 In: Optics express vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Spatial carrier interferometry from M temporal phase shifted interferograms: Squeezing Interferometry. [electronic resource] by Servin, M Cywiak, M Malacara-Hernandez, D Estrada, J C Quiroga, J A Producer: 20080821 In: Optics express vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)