Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination. [electronic resource]

By: Contributor(s): Producer: 20110927Description: 31-9 p. digitalISSN:
  • 1365-2818
Online resources: In: Journal of microscopy vol. 243
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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