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	1.	Electron microscopy: Better vision with electron lenses. [electronic resource] by Cockayne, David Producer: 20030415 In: Nature materials vol. 1 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	The preferred CSL misorientation distribution in polycrystalline SrTiO3. [electronic resource] by Park, Myung-Beom Shih, Shao-Ju Cockayne, David J H Producer: 20071011 In: Journal of microscopy vol. 227 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	The interpretation of indexing of high Sigma CSL grain boundaries from ceramics. [electronic resource] by Shih, Shao-Ju Park, Myung-Beom Cockayne, David J H Producer: 20071011 In: Journal of microscopy vol. 227 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	New possibilities with aberration-corrected electron microscopy. [electronic resource] by Cockayne, David Kirkland, Angus I Nellist, Peter D Bleloch, Andrew Producer: 20090930 In: Philosophical transactions. Series A, Mathematical, physical, and engineering sciences vol. 367 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Dependence of surface facet period on the diameter of nanowires. [electronic resource] by Li, Fang Nellist, Peter D Lang, Christian Cockayne, David J H Producer: 20100507 In: ACS nano vol. 4 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Rapid fabrication of nanoneedle arrays by ion sputtering. [electronic resource] by Huang, Yi-Zhong Cockayne, David J H Ana-Vanessa, Jausovec Cowburn, Russell P Wang, Shou-Guo Ward, Roger C C Producer: 20121002 In: Nanotechnology vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. [electronic resource] by Hutchison, John L Titchmarsh, John M Cockayne, David J H Doole, Ron C Hetherington, Crispin J D Kirkland, Angus I Sawada, H Producer: 20050502 In: Ultramicroscopy vol. 103 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Direct imaging and chemical identification of the encapsulated metal atoms in bimetallic endofullerene peapods. [electronic resource] by Nicholls, Rebecca J Sader, Kasim Warner, Jamie H Plant, Simon R Porfyrakis, Kyriakos Nellist, Peter D Briggs, G Andrew D Cockayne, David J H Producer: 20101207 In: ACS nano vol. 4 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Experimental evaluation of a spherical aberration-corrected TEM and STEM. [electronic resource] by Sawada, Hidetaka Tomita, Takeshi Naruse, Mikio Honda, Toshikazu Hambridge, Paul Hartel, Peter Haider, Maximilian Hetherington, Crispin Doole, Ron Kirkland, Angus Hutchison, John Titchmarsh, John Cockayne, David Producer: 20051025 In: Journal of electron microscopy vol. 54 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)