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	1.	Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam. [electronic resource] by McBride, W Cockayne, D J H Tsuda, K Producer: 20030411 In: Ultramicroscopy vol. 94 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Electron diffraction from nanovolumes of amorphous material using coherent convergent illumination. [electronic resource] by McBride, W Cockayne, D J H Nguyen-Manh, D Producer: 20030514 In: Ultramicroscopy vol. 96 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis. [electronic resource] by Anstis, G R Cai, D Q Cockayne, D J H Producer: 20030411 In: Ultramicroscopy vol. 94 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Simulated electron energy loss spectra from a C70 crystal. [electronic resource] by Nicholls, R J Nguyen-Manh, D Cockayne, D J H Producer: 20060816 In: Micron (Oxford, England : 1993) vol. 37 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Real time observation of GeSi/Si(001) island shrinkage due to surface alloying during Si capping. [electronic resource] by Lang, C Kodambaka, S Ross, F M Cockayne, D J H Producer: 20070328 In: Physical review letters vol. 97 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Self-assembled periodical polycrystalline-ZnO/a-C nanolayers on Zn nanowire. [electronic resource] by Li, Quan Kwong, K W Ozkaya, D Cockayne, D J H Producer: 20040629 In: Physical review letters vol. 92 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	[001] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(001). [electronic resource] by Liao, X Z Zou, J Cockayne, D J H Matsumura, S Producer: 20040519 In: Ultramicroscopy vol. 98 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)