Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy. [electronic resource]

By: Contributor(s): Producer: 20120319Description: 1630-5 p. digitalISSN:
  • 1879-2723
Online resources: In: Ultramicroscopy vol. 111
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Publication Type: Journal Article

There are no comments on this title.

to post a comment.