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	1.	Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method. [electronic resource] by Chao, Calvin Yi-Ping Tu, Honyih Wu, Thomas Meng-Hsiu Chou, Kuo-Yu Yeh, Shang-Fu Yin, Chin Lee, Chih-Lin Producer: 20180223 In: Sensors (Basel, Switzerland) vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. [electronic resource] by Chao, Calvin Yi-Ping Yeh, Shang-Fu Wu, Meng-Hsu Chou, Kuo-Yu Tu, Honyih Lee, Chih-Lin Yin, Chin Paillet, Philippe Goiffon, Vincent Producer: 20191217 In: Sensors (Basel, Switzerland) vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	A 45 nm Stacked CMOS Image Sensor Process Technology for Submicron Pixel. [electronic resource] by Takahashi, Seiji Huang, Yi-Min Sze, Jhy-Jyi Wu, Tung-Ting Guo, Fu-Sheng Hsu, Wei-Cheng Tseng, Tung-Hsiung Liao, King Kuo, Chin-Chia Chen, Tzu-Hsiang Chiang, Wei-Chieh Chuang, Chun-Hao Chou, Keng-Yu Chung, Chi-Hsien Chou, Kuo-Yu Tseng, Chien-Hsien Wang, Chuan-Joung Yaung, Dun-Nien Producer: 20180222 In: Sensors (Basel, Switzerland) vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)