APA

Chon H., Park G., Lee S., Yoon S., Kim J., Lee J. & An K. (20070327). Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy. : Journal of the Optical Society of America. A, Optics, image science, and vision.

Chicago

Chon Hyung-Su, Park Gisung, Lee Sang-Bum, Yoon Seokchan, Kim Jaisoon, Lee Jai-Hyung and An Kyungwon. 20070327. Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy. : Journal of the Optical Society of America. A, Optics, image science, and vision.

Harvard

Chon H., Park G., Lee S., Yoon S., Kim J., Lee J. and An K. (20070327). Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy. : Journal of the Optical Society of America. A, Optics, image science, and vision.

MLA

Chon Hyung-Su, Park Gisung, Lee Sang-Bum, Yoon Seokchan, Kim Jaisoon, Lee Jai-Hyung and An Kyungwon. Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy. : Journal of the Optical Society of America. A, Optics, image science, and vision. 20070327.