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	1.	Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope. [electronic resource] by Hieckmann, Ellen Nacke, Markus Allardt, Matthias Bodrov, Yury Chekhonin, Paul Skrotzki, Werner Weber, Jörg Producer: 20170707 In: Journal of visualized experiments : JoVE no. 111 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Hall-plot of the phase diagram for Ba(Fe1-xCox)2As2. [electronic resource] by Iida, Kazumasa Grinenko, Vadim Kurth, Fritz Ichinose, Ataru Tsukada, Ichiro Ahrens, Eike Pukenas, Aurimas Chekhonin, Paul Skrotzki, Werner Teresiak, Angelika Hühne, Ruben Aswartham, Saicharan Wurmehl, Sabine Mönch, Ingolf Erbe, Manuela Hänisch, Jens Holzapfel, Bernhard Drechsler, Stefan-Ludwig Efremov, Dmitri V Producer: 20180426 In: Scientific reports vol. 6 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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