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	1.	Evolution of ELNES spectra as a function of experimental settings for any uniaxial specimen: a fully relativistic study. [electronic resource] by Bocquet, F Bernier, N Saikaly, W Brosset, C Thibault, J Charaï, A Producer: 20070220 In: Ultramicroscopy vol. 107 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Morphology and microstructure at different scales of porous silicon prepared by a nonconventional technique. [electronic resource] by Mliki, N Kaabi, H Bessaïs, B Yangui, B Saikaly, W Dominici, C Charaï, A Producer: 20040504 In: Journal of nanoscience and nanotechnology vol. 3 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Optimized FIB silicon samples suitable for lattice parameters measurements by convergent beam electron diffraction. [electronic resource] by Alexandre, L Rousseau, K Alfonso, C Saikaly, W Fares, L Grosjean, C Charaï, A Producer: 20080605 In: Micron (Oxford, England : 1993) vol. 39 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	HOLZ lines splitting on SiGe/Si relaxed samples: analytical solutions for the kinematical equation. [electronic resource] by Alfonso, C Alexandre, L Leroux, Ch Jurczak, G Saikaly, W Charaï, A Thibault-Penisson, J Producer: 20100618 In: Ultramicroscopy vol. 110 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Correlated TKD/EDS - TEM - APT analysis on selected interfaces of CoSi [electronic resource] by Zschiesche, H Campos, A P C Dominici, C Roussel, L Charai, A Mangelinck, D Alfonso, C Publication details: Ultramicroscopy Nov 2019 In: Ultramicroscopy vol. 206 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)