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Binary pseudo-random patterned structures for modulation transfer function calibration and resolution characterization of a full-field transmission soft x-ray microscope. [electronic resource] by
- Yashchuk, V V
- Fischer, P J
- Chan, E R
- Conley, R
- McKinney, W R
- Artemiev, N A
- Bouet, N
- Cabrini, S
- Calafiore, G
- Lacey, I
- Peroz, C
- Babin, S
Producer: 20160425
In:
The Review of scientific instruments vol. 86
Availability: No items available.
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