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Quantitative Evaluation of Bone Microstructure using High-Resolution Extremity Cone-Beam CT with a CMOS Detector. [electronic resource] by
- Subramanian, S
- Brehler, M
- Cao, Q
- Quevedo Gonzalez, F J
- Breighner, R E
- Carrino, J A
- Wright, T
- Yorkston, J
- Siewerdsen, J H
- Zbijewski, W
Publication details: Proceedings of SPIE--the International Society for Optical Engineering Feb 2019
In:
Proceedings of SPIE--the International Society for Optical Engineering vol. 10953
Availability: No items available.
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