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Results of search for 'au:"Bouzy, E"'
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Authors
Bouzy, E
Brodu, E
Brunetti, G
Chen, C
Daloz, D
Darrieulat, M
Denis, S
Farooq, M U
Fundenberger, J J
Fundenberger, J-J
Goran, D
Guyon, J
Hazotte, A
Hoffmann, M J
Kennedy, J R
Kungl, H
Morawiec, A
Paul, H
Tidu, A
Yuan, H
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Topics
Crystallization
Crystallography
Lead
Microscopy, Electron
Titanium
X-Ray Diffraction
Zirconium
analysis
methods
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Languages
English
g d
Your search returned 11 results.
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1.
Diffraction contrast dependence on sample thickness and incident energy in on-axis Transmission Kikuchi Diffraction in SEM.
[electronic resource]
by
Brodu, E
Bouzy, E
Fundenberger, J-J
Producer:
20180731
In:
Ultramicroscopy
vol. 181
Online resources:
Available from publisher's website
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2.
Shear banding phenomenon in a Cu-8 at.% Al alloy analysed by orientation imaging microscopy.
[electronic resource]
by
Paul, H
Morawiec, A
Darrieulat, M
Bouzy, E
Producer:
20100830
In:
Journal of microscopy
vol. 237
Online resources:
Available from publisher's website
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3.
Polycrystal orientation maps from TEM.
[electronic resource]
by
Fundenberger, J-J
Morawiec, A
Bouzy, E
Lecomte, J S
Producer:
20030514
In:
Ultramicroscopy
vol. 96
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4.
Orientation precision of TEM-based orientation mapping techniques.
[electronic resource]
by
Morawiec, A
Bouzy, E
Paul, H
Fundenberger, J J
Producer:
20140815
In:
Ultramicroscopy
vol. 136
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5.
Effect of Inoculant Alloy Selection and Particle Size on Efficiency of Isomorphic Inoculation of Ti-Al.
[electronic resource]
by
Kennedy, J R
Rouat, B
Daloz, D
Bouzy, E
Zollinger, J
Publication details:
Materials (Basel, Switzerland)
Apr 2018
In:
Materials (Basel, Switzerland)
vol. 11
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6.
Determination of lattice parameters from multiple CBED patterns: a statistical approach.
[electronic resource]
by
Brunetti, G
Bouzy, E
Fundenberger, J J
Morawiec, A
Tidu, A
Producer:
20100618
In:
Ultramicroscopy
vol. 110
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7.
Shear banding in twinned structure of copper deformed at 77 K.
[electronic resource]
by
Paul, H A
Morawiec, A
Bouzy, E
Fundenberger, J J
Piatkowski, A
Producer:
20061221
In:
Journal of microscopy
vol. 223
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8.
Orientation mapping by transmission-SEM with an on-axis detector.
[electronic resource]
by
Fundenberger, J J
Bouzy, E
Goran, D
Guyon, J
Yuan, H
Morawiec, A
Producer:
20160504
In:
Ultramicroscopy
vol. 161
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9.
Determination of γ-γ' lattice misfit in a single-crystal nickel-based superalloy using convergent beam electron diffraction aided by finite element calculations.
[electronic resource]
by
Brunetti, G
Settefrati, A
Hazotte, A
Denis, S
Fundenberger, J-J
Tidu, A
Bouzy, E
Producer:
20120419
In:
Micron (Oxford, England : 1993)
vol. 43
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10.
On-axis versus off-axis Transmission Kikuchi Diffraction technique: application to the characterisation of severe plastic deformation-induced ultrafine-grained microstructures.
[electronic resource]
by
Yuan, H
Brodu, E
Chen, C
Bouzy, E
Fundenberger, J-J
Toth, L S
Publication details:
Journal of microscopy
07 2017
In:
Journal of microscopy
vol. 267
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11.
Using EBSD and TEM-Kikuchi patterns to study local crystallography at the domain boundaries of lead zirconate titanate.
[electronic resource]
by
Farooq, M U
Villaurrutia, R
MacLaren, I
Kungl, H
Hoffmann, M J
Fundenberger, J-J
Bouzy, E
Producer:
20080731
In:
Journal of microscopy
vol. 230
Online resources:
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