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	1.	Focused electron-beam-induced deposition of 3 nm dots in a scanning electron microscope. [electronic resource] by van Kouwen, Leon Botman, Aurelien Hagen, Cornelis W Producer: 20090702 In: Nano letters vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Spontaneous growth of gallium-filled microcapillaries on ion-bombarded GaN. [electronic resource] by Botman, Aurelien Bahm, Alan Randolph, Steven Straw, Marcus Toth, Milos Producer: 20140725 In: Physical review letters vol. 111 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Maskless milling of diamond by a focused oxygen ion beam. [electronic resource] by Martin, Aiden A Randolph, Steven Botman, Aurelien Toth, Milos Aharonovich, Igor Producer: 20150514 In: Scientific reports vol. 5 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Focused electron beam induced etching of copper in sulfuric acid solutions. [electronic resource] by Boehme, Lindsay Bresin, Matthew Botman, Aurélien Ranney, James Hastings, J Todd Producer: 20160219 In: Nanotechnology vol. 26 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Liquid phase electron-beam-induced deposition on bulk substrates using environmental scanning electron microscopy. [electronic resource] by Bresin, Matthew Botman, Aurelien Randolph, Steven J Straw, Marcus Hastings, Jeffrey Todd Producer: 20150415 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Radiation-Induced Damage and Recovery of Ultra-Nanocrystalline Diamond: Toward Applications in Harsh Environments. [electronic resource] by Martin, Aiden A Filevich, Jorge Straw, Marcus Randolph, Steven Botman, Aurélien Aharonovich, Igor Toth, Milos Producer: 20180724 In: ACS applied materials & interfaces vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)