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Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS. [electronic resource] by
- Belsey, Natalie A
- Cant, David J H
- Minelli, Caterina
- Araujo, Joyce R
- Bock, Bernd
- Brüner, Philipp
- Castner, David G
- Ceccone, Giacomo
- Counsell, Jonathan D P
- Dietrich, Paul M
- Engelhard, Mark H
- Fearn, Sarah
- Galhardo, Carlos E
- Kalbe, Henryk
- Won Kim, Jeong
- Lartundo-Rojas, Luis
- Luftman, Henry S
- Nunney, Tim S
- Pseiner, Johannes
- Smith, Emily F
- Spampinato, Valentina
- Sturm, Jacobus M
- Thomas, Andrew G
- Treacy, Jon P W
- Veith, Lothar
- Wagstaffe, Michael
- Wang, Hai
- Wang, Meiling
- Wang, Yung-Chen
- Werner, Wolfgang
- Yang, Li
- Shard, Alexander G
Publication details: The journal of physical chemistry. C, Nanomaterials and interfaces Oct 2016
In:
The journal of physical chemistry. C, Nanomaterials and interfaces vol. 120
Availability: No items available.
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