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Imaging Carrier Inhomogeneities in Ambipolar Tellurene Field Effect Transistors. [electronic resource] by
- Berweger, Samuel
- Qiu, Gang
- Wang, Yixiu
- Pollard, Benjamin
- Genter, Kristen L
- Tyrrell-Ead, Robert
- Wallis, T Mitch
- Wu, Wenzhuo
- Ye, Peide D
- Kabos, Pavel
Producer: 20190319
In:
Nano letters vol. 19
Availability: No items available.
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Microwave near-field imaging of two-dimensional semiconductors. [electronic resource] by
- Berweger, Samuel
- Weber, Joel C
- John, Jimmy
- Velazquez, Jesus M
- Pieterick, Adam
- Sanford, Norman A
- Davydov, Albert V
- Brunschwig, Bruce
- Lewis, Nathan S
- Wallis, Thomas M
- Kabos, Pavel
Producer: 20150625
In:
Nano letters vol. 15
Availability: No items available.
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GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy. [electronic resource] by
- Weber, Joel C
- Blanchard, Paul T
- Sanders, Aric W
- Gertsch, Jonas C
- George, Steven M
- Berweger, Samuel
- Imtiaz, Atif
- Coakley, Kevin J
- Wallis, Thomas M
- Bertness, Kris A
- Kabos, Pavel
- Sanford, Norman A
- Bright, Victor M
Producer: 20150330
In:
Nanotechnology vol. 25
Availability: No items available.
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