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	1.	Sub-angstrom low-voltage performance of a monochromated, aberration-corrected transmission electron microscope. [electronic resource] by Bell, David C Russo, Christopher J Benner, Gerd Producer: 20101014 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	In situ observation of electron beam-induced phase transformation of CaCO3 to CaO via ELNES at low electron beam energies. [electronic resource] by Golla-Schindler, Ute Benner, Gerd Orchowski, Alexander Kaiser, Ute Producer: 20150415 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	SESAM: exploring the frontiers of electron microscopy. [electronic resource] by Koch, Christoph T Sigle, Wilfried Höschen, Rainer Rühle, Manfred Essers, Erik Benner, Gerd Matijevic, Marko Producer: 20091201 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Visualizing a homogeneous blend in bulk heterojunction polymer solar cells by analytical electron microscopy. [electronic resource] by Pfannmöller, Martin Flügge, Harald Benner, Gerd Wacker, Irene Sommer, Christoph Hanselmann, Michael Schmale, Stephan Schmidt, Hans Hamprecht, Fred A Rabe, Torsten Kowalsky, Wolfgang Schröder, Rasmus R Producer: 20111201 In: Nano letters vol. 11 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Accurate measurement of electron beam induced displacement cross sections for single-layer graphene. [electronic resource] by Meyer, Jannik C Eder, Franz Kurasch, Simon Skakalova, Viera Kotakoski, Jani Park, Hye Jin Roth, Siegmar Chuvilin, Andrey Eyhusen, Sören Benner, Gerd Krasheninnikov, Arkady V Kaiser, Ute Producer: 20121123 In: Physical review letters vol. 108 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)