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	1.	Parametric equation for the locus of invariant-ellipticity States of an optical system. [electronic resource] by Azzam, R M Bashara, N M Producer: 20121002 In: Applied optics vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Optical properties of Zircaloy and Zircaloy oxide by ellipsometry. [electronic resource] by Bashara, N M Peng, Y K Producer: 20121002 In: Applied optics vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Analogy between linear optical systems and linear two-port electrical networks. [electronic resource] by Azzam, R M Bashara, N M Producer: 20121002 In: Applied optics vol. 11 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Loci of invariant-azimuth and invariant-ellipticity polarization States of an optical system. [electronic resource] by Azzam, R M Bashara, N M Producer: 20121002 In: Applied optics vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	In process ellipsometer azimuth angle calibration. [electronic resource] by Adams, J R Bashara, N M Producer: 20121002 In: Applied optics vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Parameter correlation and precision in multiple-angle ellipsometry. [electronic resource] by Bu-Abbud, G H Bashara, N M Producer: 20121002 In: Applied optics vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Optimizing null ellipsometry for oxidized silicon. [electronic resource] by Bu-Abbud, G H Bashara, N M Producer: 20121002 In: Applied optics vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Trajectories describing the evolution of polarized light in homogeneous anisotropic media and liquid crystals. [electronic resource] by Azzam, R M Merrill, B E Bashara, N M Producer: 20121002 In: Applied optics vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	High precision alignment procedure for an ellipsometer. [electronic resource] by Zeidler, J R Kohles, R B Bashara, N M Producer: 20121002 In: Applied optics vol. 13 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Beam deviation errors in ellipsometric measurements; an analysis. [electronic resource] by Zeidler, J R Kohles, R B Bashara, N M Producer: 20121002 In: Applied optics vol. 13 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Sensitivity of the Ellipsometric Parameters to Angle-of-Incidence Variations. [electronic resource] by Zeidler, J R Kohles, R B Bashara, N M Producer: 20121002 In: Applied optics vol. 13 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Combined reflection and transmission thin-film ellipsometry: a unified linear analysis. [electronic resource] by Azzam, R M Elshazly-Zaghloul, M Bashara, N M Producer: 20121002 In: Applied optics vol. 14 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Ellipsometer nulling: convergence and speed. [electronic resource] by Confer, D L Azzam, R M Bashara, N M Producer: 20121002 In: Applied optics vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)