Your search returned 2 results.

Results
	1.	Effect of the electrode materials on the drain-bias stress instabilities of In-Ga-Zn-O thin-film transistors. [electronic resource] by Bak, Jun Yong Yang, Sinhyuk Ryu, Min Ki Ko Park, Sang Hee Hwang, Chi Sun Yoon, Sung Min Producer: 20130318 In: ACS applied materials & interfaces vol. 4 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Origin of degradation phenomenon under drain bias stress for oxide thin film transistors using IGZO and IGO channel layers. [electronic resource] by Bak, Jun Yong Kang, Youngho Yang, Shinhyuk Ryu, Ho-Jun Hwang, Chi-Sun Han, Seungwu Yoon, Sung-Min Producer: 20150630 In: Scientific reports vol. 5 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

Refine your search