Your search returned 16 results.

Results
	1.	Optimizing precision of rotating-analyzer and rotating-compensator ellipsometers. [electronic resource] by Aspnes, D E Producer: 20040331 In: Journal of the Optical Society of America. A, Optics, image science, and vision vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Approximate solution of ellipsometric equations for optically biaxial crystals. [electronic resource] by Aspnes, D E Producer: 19810219 In: Journal of the Optical Society of America vol. 70 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Alignment of an optically active biplate compensator. [electronic resource] by Aspnes, D E Producer: 20121002 In: Applied optics vol. 10 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Imaging performance of mirror pairs for grazing-incidence applications: a comparison. [electronic resource] by Aspnes, D E Producer: 20121002 In: Applied optics vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Comments on the determination of the absolute alignment of a polarizer. [electronic resource] by Aspnes, D E Producer: 20121002 In: Applied optics vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Precision bounds to ellipsometer systems. [electronic resource] by Aspnes, D E Producer: 20121002 In: Applied optics vol. 14 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometers. [electronic resource] by Yasuda, T Aspnes, D E Producer: 20121002 In: Applied optics vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimeters. [electronic resource] by Aspnes, D E Studna, A A Producer: 20080910 In: The Review of scientific instruments vol. 49 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Geometrically exact ellipsometer alignment. [electronic resource] by Aspnes, D E Studna, A A Producer: 20121002 In: Applied optics vol. 10 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	High precision scanning ellipsometer. [electronic resource] by Aspnes, D E Studna, A A Producer: 20121002 In: Applied optics vol. 14 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Multiple determination of the optical constants of thin-film coating materials: a Rh sequel. [electronic resource] by Aspnes, D E Craighead, H G Producer: 20121002 In: Applied optics vol. 25 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Detection and analysis of depolarization artifacts in rotating-compensator polarimeters. [electronic resource] by Li, S F Opsal, J Chu, H Aspnes, D E Producer: 20010222 In: Journal of the Optical Society of America. A, Optics, image science, and vision vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Critical Test of the Interaction of Surface Plasmon Resonances with Molecular Vibrational Transitions. [electronic resource] by Sachet, Edward Aspnes, D E Maria, J-P Franzen, Stefan Publication details: The journal of physical chemistry. A Mar 2020 In: The journal of physical chemistry. A vol. 124 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Grating method for determining the absolute angle of incidence of ellipsometric samples in remote locations. [electronic resource] by Quinn, W E Van der Gaag, B P Schiavone, L M Aspnes, D E Producer: 20121002 In: Applied optics vol. 31 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films. [electronic resource] by Franzen, Stefan Rhodes, Crissy Cerruti, Marta Gerber, Ralph W Losego, Mark Maria, Jon-Paul Aspnes, D E Producer: 20100201 In: Optics letters vol. 34 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	Nondestructive analysis of coated periodic nanostructures from optical data. [electronic resource] by Ghong, T H Han, S-H Chung, J-M Byun, J S Kim, T J Aspnes, D E Kim, Y D Park, I H Kim, Y-W Producer: 20100602 In: Optics letters vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)