APA
Núñez-Olvera O., Balderas-Navarro R. E., Ortega-Gallegos J., Guevara-Macías L. E., Armenta-Franco A., Lastras-Montaño M. A., Lastras-Martínez L. F. & Lastras-Martínez A. (20130930). A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub-second time resolution. : The Review of scientific instruments.
Chicago
Núñez-Olvera O, Balderas-Navarro R E, Ortega-Gallegos J, Guevara-Macías L E, Armenta-Franco A, Lastras-Montaño M A, Lastras-Martínez L F and Lastras-Martínez A. 20130930. A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub-second time resolution. : The Review of scientific instruments.
Harvard
Núñez-Olvera O., Balderas-Navarro R. E., Ortega-Gallegos J., Guevara-Macías L. E., Armenta-Franco A., Lastras-Montaño M. A., Lastras-Martínez L. F. and Lastras-Martínez A. (20130930). A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub-second time resolution. : The Review of scientific instruments.
MLA
Núñez-Olvera O, Balderas-Navarro R E, Ortega-Gallegos J, Guevara-Macías L E, Armenta-Franco A, Lastras-Montaño M A, Lastras-Martínez L F and Lastras-Martínez A. A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub-second time resolution. : The Review of scientific instruments. 20130930.