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Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment. [electronic resource] by
- Mom, Rik V
- Onderwaater, Willem G
- Rost, Marcel J
- Jankowski, Maciej
- Wenzel, Sabine
- Jacobse, Leon
- Alkemade, Paul F A
- Vandalon, Vincent
- van Spronsen, Matthijs A
- van Weeren, Matthijs
- Crama, Bert
- van der Tuijn, Peter
- Felici, Roberto
- Kessels, Wilhelmus M M
- Carlà, Francesco
- Frenken, Joost W M
- Groot, Irene M N
Producer: 20180806
In:
Ultramicroscopy vol. 182
Availability: No items available.
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