Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy. [electronic resource]

By: Contributor(s): Producer: 20100715Description: 1387-92 p. digitalISSN:
  • 1530-6992
Subject(s): Online resources: In: Nano letters vol. 10
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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